Journal article
Depth Profiling of Functionalized Silane Films on Quartz and Silicon Substrates and of Urease Immobilized on Such Films by Angle-Resolved X-ray Photoelectron Spectroscopy
Authors
Kallury KMR; Brennan JD; Krull UJ
Journal
Analytical Chemistry, Vol. 67, No. 15, pp. 2625–2634
Publisher
American Chemical Society (ACS)
Publication Date
August 1, 1995
DOI
10.1021/ac00111a021
ISSN
0003-2700