Non-targeted analysis of electronics waste by comprehensive two-dimensional gas chromatography combined with high-resolution mass spectrometry: Using accurate mass information and mass defect analysis to explore the data Academic Article uri icon

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authors

  • Ubukata, Masaaki
  • Jobst, Karl
  • Reiner, Eric J
  • Reichenbach, Stephen E
  • Tao, Qingping
  • Hang, Jiliang
  • Wu, Zhanpin
  • Dane, A John
  • Cody, Robert B

publication date

  • May 2015