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Photoluminescence Study of an Er-Doped Si-Rich SiO...
Journal article

Photoluminescence Study of an Er-Doped Si-Rich SiO x Film: Effects of Annealing Gas Ambients and Double-Step Processes

Abstract

We have studied photoluminescence (PL) from samples of Er-doped Si-rich silicon oxide (SRSO) annealed at for in , (FG1), (FG2), and , respectively, or subjected to double-step annealing processes. For the given film composition, the PL spectra of the samples annealed in , FG1, or FG2 are similar in shape but reveal small differences in the intensities of emission bands; while the spectra are qualitatively different in the case of oxidation. By …

Authors

Heng CL; Zalloum OHY; Roschuk T; Blakie D; Wojcik J; Mascher P

Journal

Electrochemical and Solid-State Letters, Vol. 10, No. 7,

Publisher

The Electrochemical Society

Publication Date

2007

DOI

10.1149/1.2735815

ISSN

1099-0062

Labels

Fields of Research (FoR)