Defect Depth Profile in CdTe :  CI  by Positron Annihilation

Depth resolved defect profiles have been obtained from samples using both positron lifetime spectroscopy and Doppler‐broadening of annihilation radiation spectra. The dominant defect species was identified as the chlorine‐vacancy complex or A center. The defect concentration in the bulk was found to be , with a much higher near‐surface concentration, in agreement with chlorine concentration profiles obtained using the radiotracer sectioning technique. It is proposed that the vacancy is involved in the diffusion of atoms. ©2000 The Electrochemical Society