A new method for measuring the threshold voltage of small-geometry MOSFETs from subthreshold conduction
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Overview
status
publication date
- May 1990
has subject area
- 0204 Condensed Matter Physics (FoR)
- 0205 Optical Physics (FoR)
- 0906 Electrical and Electronic Engineering (FoR)
- Applied Physics (Science Metrix)
published in
- Solid-State Electronics Journal